Hitachi EA6000VX X-Ray Fluorescence equipment

XRF that can perform point analysis and fast mapping. Equipped with a Vortex Silicon Drift detector.

Acquired November 2013 and managed by José António de Carvalho Paixão

Location: TAIL-UC Trace Analysis and Imaging Laboratory (F.16)

How can you have access to it?

This instrument is available to the UC scientific community, external scientific community and industrial users under the general UC policy for access to the UC analytical platforms. Please contact the instrument responsible or TAIL-UC director for details of instrument availability and usage charge rates.


Typical Data

XRF analysis of yellow lime stone