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Positron Annihilation and Constant Photocurrent Method Measurtements on a-Si:H films: a Comparative Approach to Defect Identification

Authors: P.M. Gordo, M.F. Ferreira Marques, A.P. de Lima, G. Lavareda, C. Nunes de Carvalho, A. Amaral, Zs. Kajcsos

Ref.: Rad. Phys. Chemistry 76 (2007)