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Investigation of micro- and nanoscale barrier layer capacitance mechanisms of conductivity in CaCu3Ti4O12 via scanning probe microscopy technique

Authors: Ivanov, M. S.; Amaral, F.; Khomchenko, V. A.; Paixao, J. A.; Costa, L. C.

Ref.: RSC Adv. 7(65), 40695-40704 (2017)

DOI: 10.1039/C7RA06385G