Bruker D8 Advance X-ray powder diffractometer

X-ray diffractometer for polycrystalline samples with twin-twin optics (Bragg-Brentano and parallel beam geometry with Goebel mirrors) for conventional powder XRD, grazing incidence XRD and X-ray reflectometry. The diffractometer works with Cu Ka radiation (2.2kW ceramic tube, beta line attenuation with either a Ni foil filter or by means of the Goebel mirror). Detection system: 1D LynxEye detector (Silicon Drift Detector) covering and angle of ~3º and with ~25% energy resolution.

The system is equipped with a motorised XYZ stage and two Si low-background sample holders (one for controlled atmosphere) are available. An MRI MTC-HIGHTEMP sample furnace (1450 ºC) is available for high temperature studies.

Sample holders

  1. PMMA sample holders.
  2. Airtight silicon crystal low background specimen holder ring with dome-type, X-ray transparent cap, for environmental sensitive materials. Ø 51.5 mm PMMA ring with Ø 20 mm silicon crystal and 0.5 mm specimen well.
  3. Airtight silicon crystal low background specimen holder ring with dome-type, X-ray transparent cap, for environmental sensitive materials. Ø 51.5 mm steel ring with Ø 25 silicon crystal. The cap is equipped with a fixed knife edge to reduce air scattering at low angles 2Theta.
  4. Vacuum chuck 5" for precise mounting of wafers, glass plates or other at samples by vacuum.
  5. Lindman-glass capillaries (for transmission geometry).

Software for data-analysis

  1. EVA (interfaced with COD and ICDD databases)
  2. TOPAS (Rietveld refinement)
  3. LEPTOS (reflectometry)

Crystallographic databases

  1. COD
  2. ICDD PDF-4



Acquired June 2013 and managed by José António Paixão

Location: TAIL-UC Trace Analysis and Imaging Laboratory (F.16)

How can you have access to it?

This instrument is available to the UC scientific community, external scientific community and industrial users under the general UC policy for access to the UC analytical platforms. Please contact the instrument responsible or TAIL-UC director for details of instrument availability and usage charge rates.

Co-financiamento:

Standard Operating Procedure

D8 resolution function, Bragg-Brentano geometry

Training

XRD training

Powder XRD good practices

X-Ray Reflectometry good practices

Typical Data

Rietveld refinement of XRD data on the multiferroic ceramic samples of Bi0.9La0.1Fe1−yTiyO3 (0 ⩽ y ⩽ 0.1)

Anatase-Rutile phase transformation

Anatase-Rutile phase transformation 2D plot