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Characterization of the Interfacial Defect Layer in Chalcopyrite Solar Cells by Depth-Resolved Muon Spin Spectroscopy
Authors: Alberto, HV; Vilao, RC; Ribeiro, EFM; Gil, JM; Curado, MA; Teixeira, JP; Fernandes, PA; Cunha, JMV; Salome, PMP; Edoff, M; Martins, MI; Prokscha, T; Salman, Z; Weidinger, A
Ref.: Adv. Mater. Interfaces 9(19) (2022)
