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On the defect pattern evolution in sapphire irradiated by swift ions in a broad fluence range

Authors: P.M. Gordo, L. Liszkay, Zs. Kajcsos, K Havancsák, V.A. Skuratov, G. Kögel, P. Sperr, W. Egger, A.P. de Lima, M.F. Ferreira Marques

Ref.: Applied Surface Science 255 (2008)