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Enhancement of local piezoelectric properties of a perforated ferroelectric thin film visualized via piezoresponse force microscopy

Authors: Ivanov, M. S.; Sherstyuk, N. E.; Mishina, E. D.; Khomchenko, V. A.; Tselev, A.; Mukhortov, V. M.; Paixao, J. A.; Kholkin, A. L.

Ref.: J. Phys. D: Appl. Phys. 50(42), 425303 (2017)

DOI: 10.1088/1361-6463/aa8604