2020 | 2019 | 2018 | 2017 | 2016 | 2015 | 2014 | 2013 | 2012 | 2011 | 2010 | 2009 | 2008

Investigation of local conduction mechanisms in Ca and Ti-doped BiFeO3 using scanning probe microscopy approach

Authors: M. S. Ivanov; V. A. Khomchenko; M. V. Silibin; D. V. Karpinsky; C. Blawert; M. Serdechnova; J. A. Paix√£o

Ref.: Nanomaterials 10(5), 940 (2020)

DOI: 10.3390/nano10050940