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Muon implantation experiments in films: Obtaining depth-resolved information

Authors: Simoes, AFA; Alberto, HV; Vilao, RC; Gil, JM; Cunha, JMV ; Curado, MA; Salome, PMP; Prokscha, T; Suter, A; Salman, Z

Ref.: Rev. Sci. Instrum. 91(2), 023906 (2020)

DOI: 10.1063/1.5126529