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Seeing inside materials by aberration-corrected electron microscopy

Authors: Pennycook, S. J.; van Benthem, K.; Marinopoulos, A. G.; Oh, S-H.; Molina, S. I.; Borisevich, A. Y.; Luo, W.; Pantelides, S. T.

Ref.: INTERNATIONAL JOURNAL OF NANOTECHNOLOGY 8(10-12), 935-947 (2011)